Electron-Beam Evaporated Superconducting Titanium Thin Films for Antenna Coupled Transition Edge Sensors
Researchers led by Prof. SHI Sheng-Cai, from Purple Mountain Observatory of Chinese Academy of Sciences, have investigate the properties of the electron-beam evaporated Ti thin films for antenna coupled transition edge sensors. They found an appropriate deposition rate range to get superconducting Ti thin films with moderate stress, stable resistivity and maximum transition temperature, and used a power law to fit the thickness dependences of the Ti film transition temperature and resistivity very well, which will help to improve the process efficiently and fabricate high quality superconducting TESs.

Fig. 1 Deposition rate dependence of the films resistivity (Res) and transition temperature (Tc). (Image by WANG Zheng)

Fig. 2 The thickness (d) dependences of the Ti film transition temperature (Tc) and sheet resistance (Rs). (Image by WANG Zheng)